Standard Test

A Standard Double-Pulse Test is a common method for characterizing WBG power transistors. In general, it characterizes the turn-on and turn-off behavior for different supply voltages and different current levels. Two power transistors are configured in a totem-pole configuration (also called a half-bridge configuration). The Low-Side transistor is referred to as the Device Under Test (DUT). For proper operation, the body diode of the High-Side transistor is mandatory and is also used for the Reverse Recovery test.